Towards Integrated Optical Coherence Tomography System on Silicon on Insulator
نویسندگان
چکیده
Optical Coherence Tomography (OCT) is an emerging optical imaging technology with ever growing number of applications. OCT enables micron scale cross-sectional imaging of subsurface microstructures by measuring the backscattered intensity of light from subsurface layers of the materials. Current OCT imaging systems are fiber or free space optics based and they can be miniaturized through integrated photonics. We discuss the design parameters for photonic components for OCT such as broadband light source, splitters and output couplers on silicon on insulator platform, which can be fabricated using CMOS compatible wafer scale process.
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